High accuracy jitter measurement using cyclic pulse width modulation structure

Keyphrases

• Jitter Measurement 100%
• Pulse Width Modulation 100%
• Modulated Structure 100%
• Measurement Results 50%
• CMOS Process 50%
• Circuit Testing 50%
• Clock Jitter 50%
• Hardware Overhead 50%
• High-speed Circuits 50%
• Circuit Area 50%
• Clock Signal 50%
• Loading Effect 50%
• Timing Resolution 50%

Engineering

• Built-in Self Test 100%
• Pulse Width Modulation 100%
• Simulation Result 50%
• Hardware Overhead 50%
• Clock Signal 50%
• High Speed Circuit 50%
• Loading Effect 50%