Che Wei Chou, Jin Fu Li, Yun Chao Yu, Chih Yen Lo, Ding Ming Kwai, Yung Fa Chou
研究成果: 雜誌貢獻 › 評論/辯論
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Hierarchical test integration methodology for 3-D ICs. / Chou, Che Wei; Li, Jin Fu; Yu, Yun Chao 等.
TY - JOUR
T1 - Hierarchical test integration methodology for 3-D ICs
AU - Chou, Che Wei
AU - Li, Jin Fu
AU - Yu, Yun Chao
AU - Lo, Chih Yen
AU - Kwai, Ding Ming
AU - Chou, Yung Fa
PY - 2015/7/1
Y1 - 2015/7/1
UR - http://www.scopus.com/inward/record.url?scp=84936750057&partnerID=8YFLogxK
U2 - 10.1109/MDAT.2015.2427257
DO - 10.1109/MDAT.2015.2427257
M3 - 評論/辯論
AN - SCOPUS:84936750057
SN - 2168-2356
VL - 32
SP - 59
EP - 70
JO - IEEE Design and Test
JF - IEEE Design and Test
IS - 4
M1 - 7096969
ER -