Hardware Trojans of Computing-In-Memories: Issues and Methods

Shih Hsu Huang; Wei Che Cheng; Jin Fu Li

doi:10.1109/DFT59622.2023.10313529

Hardware Trojans of Computing-In-Memories: Issues and Methods

Shih Hsu Huang, Wei Che Cheng, Jin Fu Li

電機工程學系

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

摘要

Ensuring the security of memory is crucial in current processor design, where memory is not only used for data storage but also for in-memory computation. In this paper, we explore the security design of embedded memory, focusing on possible hardware Trojans. We provide an overview of existing hardware Trojan designs in the memory mode, covering both SRAM (volatile memory) and STT-MARM (non-volatile memory). Then, we propose an innovative concept for a potential hardware Trojan design in the computing mode, specifically tailored for computing-in-memories. This paper aims to provide insights into the ways in which hardware Trojans exist and the measures we can take to mitigate their impact. These insights can pave the way for exploring detection and prevention methods to enhance memory design security.

原文	???core.languages.en_GB???
主出版物標題	36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023
編輯	Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio
發行者	Institute of Electrical and Electronics Engineers Inc.
ISBN（電子）	9798350315004
DOIs	https://doi.org/10.1109/DFT59622.2023.10313529
出版狀態	已出版 - 2023
事件	36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 - Juan-Les-Pins, France 持續時間: 3 10月 2023 → 5 10月 2023

出版系列

名字	Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
ISSN（列印）	2576-1501
ISSN（電子）	2765-933X

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023
國家/地區	France
城市	Juan-Les-Pins
期間	3/10/23 → 5/10/23

存取文件

10.1109/DFT59622.2023.10313529

運算記憶體之測試與可靠性增強技術-總計畫暨子計畫一：運算記憶體之測試策略與自動化技術(3/3)
Li, J.-F. (PI)
1/08/25 → 31/07/26
研究計畫: Research

引用此

Huang, S. H., Cheng, W. C., & Li, J. F. (2023). Hardware Trojans of Computing-In-Memories: Issues and Methods. 於 L. Cassano, M. Psarakis, M. Traiola, & A. Bosio (編輯), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DFT59622.2023.10313529

Huang, Shih Hsu ; Cheng, Wei Che ; Li, Jin Fu. / Hardware Trojans of Computing-In-Memories : Issues and Methods. 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. 編輯 / Luca Cassano ; Mihalis Psarakis ; Marcello Traiola ; Alberto Bosio. Institute of Electrical and Electronics Engineers Inc., 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).

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abstract = "Ensuring the security of memory is crucial in current processor design, where memory is not only used for data storage but also for in-memory computation. In this paper, we explore the security design of embedded memory, focusing on possible hardware Trojans. We provide an overview of existing hardware Trojan designs in the memory mode, covering both SRAM (volatile memory) and STT-MARM (non-volatile memory). Then, we propose an innovative concept for a potential hardware Trojan design in the computing mode, specifically tailored for computing-in-memories. This paper aims to provide insights into the ways in which hardware Trojans exist and the measures we can take to mitigate their impact. These insights can pave the way for exploring detection and prevention methods to enhance memory design security.",

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Huang, SH, Cheng, WC & Li, JF 2023, Hardware Trojans of Computing-In-Memories: Issues and Methods. 於 L Cassano, M Psarakis, M Traiola & A Bosio (編輯), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, Institute of Electrical and Electronics Engineers Inc., 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, 3/10/23. https://doi.org/10.1109/DFT59622.2023.10313529

Hardware Trojans of Computing-In-Memories: Issues and Methods. / Huang, Shih Hsu; Cheng, Wei Che; Li, Jin Fu.
36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. 編輯 / Luca Cassano; Mihalis Psarakis; Marcello Traiola; Alberto Bosio. Institute of Electrical and Electronics Engineers Inc., 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

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Huang SH, Cheng WC, Li JF. Hardware Trojans of Computing-In-Memories: Issues and Methods. 於 Cassano L, Psarakis M, Traiola M, Bosio A, 編輯, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT). doi: 10.1109/DFT59622.2023.10313529

Hardware Trojans of Computing-In-Memories: Issues and Methods

摘要

出版系列

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專案

運算記憶體之測試與可靠性增強技術-總計畫暨子計畫一：運算記憶體之測試策略與自動化技術(3/3)

引用此