Growth of crack-free semi-polar (1-101) GaN on a 7°-off (001) Si substrate by metal-organic chemical vapor deposition

Hsien Yu Lin, Hsueh Hsing Liu, Chen Zi Liao, Jen Inn Chyi

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

摘要

This paper reports a novel selective growth method for growing crack-free semi-polar (1-101) GaN on 7°-off (001) Si substrates by adding SiO 2 stripes in perpendicular to the V-grooves on Si. This method can effectively reduce the thermal stress between GaN and Si substrate so that crack-free (1-101) GaN films as thick as 1 μm is achieved after coalescence even without an AlN interlayer. Cathodoluminescence measurements show the presence of low dislocation density areas, which can be attributed to the bending of dislocations toward to the [1-100] and [11-20] directions during the facet growth.

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主出版物標題Gallium Nitride Materials and Devices VI
DOIs
出版狀態已出版 - 2011
事件Gallium Nitride Materials and Devices VI - San Francisco, CA, United States
持續時間: 24 1月 201127 1月 2011

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
7939
ISSN(列印)0277-786X

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???event.eventtypes.event.conference???Gallium Nitride Materials and Devices VI
國家/地區United States
城市San Francisco, CA
期間24/01/1127/01/11

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