@inproceedings{b16352a2bf3548cd8f203c13aefd0f35,
title = "Grating-slit: An unusual optical surface test",
abstract = "This method uses a DMD chip to generate a sinusoidal grating as the light source and uses a slit modulating light at the image location. The transverse ray aberration function is obtained through phase shifting.",
author = "Liang, {Chao Wen} and Jose Sasian",
year = "2006",
doi = "10.1364/oft.2006.ofwa4",
language = "???core.languages.en_GB???",
isbn = "1557528187",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Optical Fabrication and Testing, OFT 2006",
note = "Optical Fabrication and Testing, OFT 2006 ; Conference date: 10-10-2006 Through 10-10-2006",
}