Gauss-elimination-based generation of multiple seed-polynomial pairs for LFSR

Keyphrases

• Pseudo-random Pattern 100%
• Multiple Seeds 100%
• Gauss Elimination 100%
• Pattern Generation 66%
• Hardware Overhead 33%
• Efficient Strategy 33%
• Fault Coverage 33%
• Benchmark Circuits 33%
• IC Testing 33%
• Pattern Sets 33%
• Full-scan 33%
• Elimination Method 33%
• Intelligent Heuristic 33%
• Deterministic Pattern 33%

Computer Science

• Gauss Elimination 100%
• linear-feedback shift register 100%
• Fault Coverage 50%
• Benchmark Circuit 50%
• Hardware Overhead 50%
• Random Pattern 50%
• Deterministic Pattern 50%