Gate leakage current induced trapping in AlGaN/GaN Schottky-gate HFETs and MISHFETs

Wen Chia Liao, Yan Lun Chen, Zheng Xing Chen, Jen Inn Chyi, Yue Ming Hsin

研究成果: 雜誌貢獻期刊論文同行評審

8 引文 斯高帕斯(Scopus)

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Engineering & Materials Science

Physics & Astronomy

Chemical Compounds