摘要
In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a `soft' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 頁面 | 267-272 |
| 頁數 | 6 |
| 出版狀態 | 已出版 - 1997 |
| 事件 | Proceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA 持續時間: 27 4月 1997 → 1 5月 1997 |
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| ???event.eventtypes.event.conference??? | Proceedings of the 1997 15th VLSI Test Symposium |
|---|---|
| 城市 | Monterey, CA, USA |
| 期間 | 27/04/97 → 1/05/97 |