Functional test pattern generation for CMOS operational amplifier

Soon Jyh Chang, Chung Len Lee, Jwu E. Chen

研究成果: 會議貢獻類型會議論文同行評審

3 引文 斯高帕斯(Scopus)

摘要

In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a `soft' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.

原文???core.languages.en_GB???
頁面267-272
頁數6
出版狀態已出版 - 1997
事件Proceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA
持續時間: 27 4月 19971 5月 1997

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???event.eventtypes.event.conference???Proceedings of the 1997 15th VLSI Test Symposium
城市Monterey, CA, USA
期間27/04/971/05/97

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