In this paper, the optimum functional patterns for CMOS operational amplifier are proposed based on an analysis to find the maximum difference between the good circuit and the faulty circuit for a CMOS operational amplifier. The theoretical and simulation results show that the derived test patterns do give the maximum difference at the output even when the circuit has a `soft' fault. The results have also been applied to generate test patterns for a programmable gain/loss mixed signal circuit.
|出版狀態||已出版 - 1997|
|事件||Proceedings of the 1997 15th VLSI Test Symposium - Monterey, CA, USA|
持續時間: 27 4月 1997 → 1 5月 1997
|???event.eventtypes.event.conference???||Proceedings of the 1997 15th VLSI Test Symposium|
|城市||Monterey, CA, USA|
|期間||27/04/97 → 1/05/97|