@inproceedings{a0d907c360844cf89079f104be19e3d2,
title = "Full-span error calibration method for on-chip quadrature accuracy measurement",
abstract = "This study focuses on a full-span calibration and detection methods of an on-wafer measurement system for quadrature voltage-controlled oscillator (QVCO). The quadrature accuracy, namely I/Q imbalances, of the QVCO was accurately measured by a high-speed oscilloscope. An on-chip calibration kit (Cal Kit) was applied to de-embed the system errors. This paper describes the test setup and calibration procedures in detail. The proposed method provides an effective full-span vertical calibration, skew calibration, and phase and amplitude differences measurement in an on-wafer measurement system. Finally, a 5 GHz QVCO was fabricated to verify the proposed methodology.",
keywords = "Full-span calibration and detection, High-speed oscilloscope, On-wafer measurement",
author = "Ou, {Ya Wen} and Chang, {Yin Cheng} and Lin, {Shuw Guann} and Chang, {Da Chiang} and Chiou, {Hwann Kaeo}",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 ; Conference date: 11-05-2015 Through 14-05-2015",
year = "2015",
month = jul,
day = "6",
doi = "10.1109/I2MTC.2015.7151442",
language = "???core.languages.en_GB???",
series = "Conference Record - IEEE Instrumentation and Measurement Technology Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1194--1197",
booktitle = "2015 IEEE International Instrumentation and Measurement Technology Conference - The {"}Measurable{"} of Tomorrow",
}