Foreword: ATS 2022

Jin Fu Li, Jing Jia Liou

研究成果: 雜誌貢獻 › 編者言

原文	???core.languages.en_GB???
頁（從 - 到）	X
期刊	Proceedings of the Asian Test Symposium
卷	2022-November
DOIs	https://doi.org/10.1109/ATS56056.2022.00005
出版狀態	已出版 - 2022
事件	31st IEEE Asian Test Symposium, ATS 2022 - Taichung, Taiwan 持續時間: 21 11月 2022 → 23 11月 2022

存取文件

@article{1107e193d5514e1ca9e2c841fdba4e2a,

title = "Foreword: ATS 2022",

author = "Li, {Jin Fu} and Liou, {Jing Jia}",

year = "2022",

doi = "10.1109/ATS56056.2022.00005",

language = "???core.languages.en_GB???",

volume = "2022-November",

pages = "X",

journal = "Proceedings of the Asian Test Symposium",

issn = "1081-7735",

note = "31st IEEE Asian Test Symposium, ATS 2022 ; Conference date: 21-11-2022 Through 23-11-2022",

}

TY - JOUR

T1 - Foreword

T2 - 31st IEEE Asian Test Symposium, ATS 2022

AU - Li, Jin Fu

AU - Liou, Jing Jia

PY - 2022

Y1 - 2022

UR - http://www.scopus.com/inward/record.url?scp=85145940434&partnerID=8YFLogxK

U2 - 10.1109/ATS56056.2022.00005

DO - 10.1109/ATS56056.2022.00005

M3 - 編者言

AN - SCOPUS:85145940434

SN - 1081-7735

VL - 2022-November

SP - X

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

Y2 - 21 November 2022 through 23 November 2022

ER -