Foreword: 26th IEEE Asian test symposium (ATS 2017)

Jiun Lang Huang, Jin Fu Li

研究成果: 雜誌貢獻 › 編者言

原文	???core.languages.en_GB???
頁（從 - 到）	x
期刊	Proceedings of the Asian Test Symposium
DOIs	https://doi.org/10.1109/ATS.2017.5
出版狀態	已出版 - 24 1月 2018
事件	26th IEEE Asian Test Symposium, ATS 2017 - Taipei, Taiwan 持續時間: 27 11月 2017 → 30 11月 2017

存取文件

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title = "Foreword: 26th IEEE Asian test symposium (ATS 2017)",

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T2 - 26th IEEE Asian Test Symposium, ATS 2017

AU - Huang, Jiun Lang

AU - Li, Jin Fu

PY - 2018/1/24

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Y2 - 27 November 2017 through 30 November 2017

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