TY - JOUR
T1 - FN-Net
T2 - A lightweight CNN-based architecture for fabric defect detection with adaptive threshold-based class determination
AU - Suryarasmi, Anindita
AU - Chang, Chin Chun
AU - Akhmalia, Rania
AU - Marshallia, Maysa
AU - Wang, Wei Jen
AU - Liang, Deron
N1 - Publisher Copyright:
© 2022 Elsevier B.V.
PY - 2022/7
Y1 - 2022/7
N2 - Deep learning technologies based on Convolution Neural Networks (CNN) have been widely used in fabric defect detection. On-site CNN model training and defect detection offer several desirable properties for the fabric manufactures, such as better data security and less connectivity requirements, when compared with the on-cloud training approach. However, computers installed at the manufacturing site are usually industrial computers with limited computing power, which are not able to run many effective CNN models. A lightweight CNN model should be used in this scenario, in order to find a balance point among defect detection, efficiency, memory consumption and model training time. This paper presents a lightweight CNN-based architecture for fabric defect detection. Compared with VGG16, MobileNetV2, EfficientNet, and DenseNet as state-of-the-art architectures, the proposed architecture, namely FN-Net, can perform training 3 to 33 times as fast as these architectures with less graphics processing unit and memory consumption. With adaptive class determination, FN-Net has an average F1 score 0.86, while VGG16 and EfficientNet as the best and the worst among the baseline models have 0.81 and 0.50, respectively.
AB - Deep learning technologies based on Convolution Neural Networks (CNN) have been widely used in fabric defect detection. On-site CNN model training and defect detection offer several desirable properties for the fabric manufactures, such as better data security and less connectivity requirements, when compared with the on-cloud training approach. However, computers installed at the manufacturing site are usually industrial computers with limited computing power, which are not able to run many effective CNN models. A lightweight CNN model should be used in this scenario, in order to find a balance point among defect detection, efficiency, memory consumption and model training time. This paper presents a lightweight CNN-based architecture for fabric defect detection. Compared with VGG16, MobileNetV2, EfficientNet, and DenseNet as state-of-the-art architectures, the proposed architecture, namely FN-Net, can perform training 3 to 33 times as fast as these architectures with less graphics processing unit and memory consumption. With adaptive class determination, FN-Net has an average F1 score 0.86, while VGG16 and EfficientNet as the best and the worst among the baseline models have 0.81 and 0.50, respectively.
KW - AOI
KW - Artificial intelligence
KW - Defect detection
KW - Fabric manufacturing
KW - Lightweight convolutional neural network
UR - http://www.scopus.com/inward/record.url?scp=85131103598&partnerID=8YFLogxK
U2 - 10.1016/j.displa.2022.102241
DO - 10.1016/j.displa.2022.102241
M3 - 期刊論文
AN - SCOPUS:85131103598
SN - 0141-9382
VL - 73
JO - Displays
JF - Displays
M1 - 102241
ER -