Fault diagnosis of odd-even sorting networks

Chih Wei Hu, Chung Len Lee, Wen Ching Wu, Jwu E. Chen

研究成果: 雜誌貢獻會議論文同行評審


This paper investigates detection and location for single faults in odd-even sorting networks. In the work, we have found that three tests are enough to locate single link fault and four tests are sufficient to detect single sorting element fault in an odd-even sorting network. For location tests for sorting element faults, the numbers of tests depend on the type of faults occurring at the sorting element. For most types of sorting element faults, the numbers are less than four specific tests. For the other types of faults, we have presented the test generation procedure and binary search procedures to generate the tests. The numbers of location tests are less than (n+log2n), where n = log2N and N is the number of inputs of the sorting network.

頁(從 - 到)288-293
期刊Proceedings of the Asian Test Symposium
出版狀態已出版 - 1997
事件Proceedings of the 1997 6th Asian Test Symposium - Akita, Jpn
持續時間: 17 11月 199719 11月 1997


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