摘要
In this study, we successfully produced the compound phase Mg 2Ni by using the liquid electromigration (EM) method. The application of a high-density current flow through the Ni/molten Mg/Ni sandwich structure caused the Ni atoms in the molten Mg to electromigrate toward the anode interface to form a thick layer of compound Mg 2Ni at the anode's molten Mg/Ni interface. The formation of the interfacial Mg 2Ni compound was much larger than that which occurs in the no-current case. This implies that the growth of the interfacial Mg 2Ni compound can be enhanced by current stressing. Remarkably, as can be seen from the X-ray diffraction (XRD) analysis, the EM-grown Mg 2Ni phase is shown to be indicative of texture in nature, that is, only one single peak [(110) plane] appears in the XRD diffraction pattern. This observation suggests that the formation of EM-grown Mg 2Ni compound at the anode interface closely corresponds to the direction of electron flow.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 1489-1494 |
頁數 | 6 |
期刊 | Journal of Electronic Materials |
卷 | 36 |
發行號 | 11 |
DOIs | |
出版狀態 | 已出版 - 11月 2007 |