Experimental techniques on the understanding of the charge loss in a SONOS nitride-storage nonvolatile memory

E. R. Hsieh, H. T. Wang, Steve S. Chung, Wayne Chang, S. D. Wang, C. H. Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

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Engineering & Materials Science