Evaluation of the spatial distribution of series and shunt resistance of a solar cell using dark lock-in thermography

Te Yuan Chung, Chung Hao Wang, Kai Jay Chang, Szu Yu Chen, Hsin Hsin Hsieh, Chao Ping Huang, Ching Hsiao Arthur Cheng

研究成果: 雜誌貢獻期刊論文同行評審

14 引文 斯高帕斯(Scopus)

摘要

A theoretical approach of using dark lock-in thermography (DLIT) to resolve series and shunt resistance spatial distribution of a solar cell is derived. The resistance distribution can be represented as a simple function of DLIT temperature amplitude and phase distribution under small signal approximation. DLIT experiment using different solar cells was performed and obtained the temperature amplitude and phase images along with the corresponding resistance images.

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文章編號034901
期刊Journal of Applied Physics
115
發行號3
DOIs
出版狀態已出版 - 21 1月 2014

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