摘要
M-plane non-polar bulk GaN substrates were regrown by hydride vapour phase epitaxy (HVPE), aiming to enlarge their lateral size. The non-polar GaN substrates were synthesized by growing thick GaN boules by HVPE along the c-axis, and wafering transversely to expose non-polar (m- or a-plane) surfaces. Non-polar GaN substrates obtained in this manner contains lower defect density comparing to those produced by heteroepitaxial growth. After the regrowth, substantial lateral expansion in [0001], [1120] and [1120] was observed. Threading dislocation densities were estimated by cathodoluminescence measured at the cross-section areas. The dislocation densities in the substrate and the regrown areas were approximately 5×106 cm-2 and 1×106 cm-2, respectively, indicating a comparable structural quality achieved by the regrowth. Non-polar GaN substrates prepared by this process provide a promising method to fabricate devices for next generation.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 1886-1888 |
頁數 | 3 |
期刊 | Physica Status Solidi (C) Current Topics in Solid State Physics |
卷 | 5 |
發行號 | 6 |
DOIs | |
出版狀態 | 已出版 - 2008 |
事件 | 7th International Conference of Nitride Semiconductors, ICNS-7 - Las Vegas, NV, United States 持續時間: 16 9月 2007 → 21 9月 2007 |