Enhancing the data analysis in IC testing by machine learning techniques

Keyphrases

• Wafer 100%
• Machine Learning Techniques 100%
• Electrical Parameters 100%
• IC Testing 100%
• Deep Learning Model 66%
• Causes of Error 66%
• Electrical Properties 33%
• Training Data 33%
• Production Cost 33%
• Design Process 33%
• SVM Classifier 33%
• Test Accuracy 33%
• IC Design 33%
• Interface Problem 33%
• Program Use 33%
• Monitoring Test 33%
• Testing Process 33%
• Deep Learning Algorithm 33%
• Site Error 33%
• Vector Set 33%
• Performance Function 33%
• Dependent Data 33%
• Validation Set 33%
• Classifier Learning 33%
• Error Types 33%
• Small Batch 33%
• Machining Error 33%
• Distribution Characteristics 33%
• Production Factors 33%
• Interface Sites 33%

Engineering

• Test Result 100%
• Machine Learning Technique 100%
• Deep Learning Method 75%
• Test Time 25%
• Test Data 25%
• Integrated Circuit Design 25%
• Design Process 25%
• Test Equipment 25%
• Main Factor 25%
• Performance Function 25%
• Data Format 25%