Enhancing Stability in CRPs: A Novel Parallel Scan-Chain PUF Design Considering Aging Effects

Keyphrases

• Aging Effect 100%
• Parallel Scan 100%
• Physical Unclonable Function 100%
• Scan Chain 100%
• Function Design 100%
• Scan Flip-flop 60%
• Aging 40%
• Error Correction Codes 40%
• Encoder 20%
• Power Consumption 20%
• Energy Saving 20%
• Decoder 20%
• Area Overhead 20%
• Novel Design 20%
• Design for Testability 20%
• Causes of Error 20%
• Unique Identifier 20%
• Bias Temperature Instability 20%
• Besides to 20%
• Information Leakage 20%
• Removal Attack 20%
• Secret Key 20%
• Unique Response 20%
• Overhead Reduction 20%
• Bose-chaudhuri-hocquenghem 20%
• Stable Response 20%
• Average Error Rate 20%
• Hardware Trojan 20%
• Signal Gating 20%
• Input Conditions 20%
• Resource Overhead 20%
• Side-channel Attacks 20%
• Security Primitive 20%
• Randomized Response 20%
• Hot Carrier Injection 20%
• Function Structure 20%
• Cryptographic Processor 20%
• Complex Error 20%

Engineering

• Aging Effect 100%
• Design Function 100%
• Flip Flop Circuits 60%
• Correction Code 40%
• Error Correction 40%
• Experimental Result 20%
• Electric Power Utilization 20%
• Testability 20%
• Area Overhead 20%
• Error Rate 20%
• Structure Function 20%
• Normal Modes 20%
• Secret Key 20%
• Input Condition 20%
• Original Circuit 20%
• Hot Carrier Injection 20%
• Side Channel Attack 20%

Computer Science

• Scan Chain 100%
• Error Correction Code 66%
• Experimental Result 33%
• Power Consumption 33%
• Sensitive Informations 33%
• Structure Function 33%
• Input Condition 33%
• Physical Threat 33%
• side-channel 33%
• Computer Hardware 33%