Enhancing flash memory reliability by jointly considering write-back pattern and block endurance

Tseng Yi Chen, Yuan Hao Chang, Yuan Hung Kuan, Ming Chang Yang, Yu Ming Chang, Pi Cheng Hsiu

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)

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Engineering & Materials Science