Enhancing flash memory reliability by jointly considering write-back pattern and block endurance
Tseng Yi Chen, Yuan Hao Chang, Yuan Hung Kuan, Ming Chang Yang, Yu Ming Chang, Pi Cheng Hsiu
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
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引文
斯高帕斯（Scopus）