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Energy straggling and multiple scattering in silicon strip detectors

  • T. Antičić
  • , R. Battiston
  • , W. Braunschweig
  • , Y. H. Chang
  • , C. Y. Chien
  • , A. E. Chen
  • , S. R. Hou
  • , C. H. Lin
  • , W. T. Lin
  • , R. Ostonen
  • , K. Spartiotis
  • , O. Syben
  • , O. Toker
  • , B. Wittmer

研究成果: 雜誌貢獻期刊論文同行評審

5 引文 斯高帕斯(Scopus)

摘要

We present a test beam study of energy straggling and multiple scattering in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scattering in crystalline structure was investigated by placing a GaAs wafer at various angles.

原文???core.languages.en_GB???
頁(從 - 到)309-314
頁數6
期刊Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
374
發行號3
DOIs
出版狀態已出版 - 1 6月 1996

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