Energy straggling and multiple scattering in silicon strip detectors

T. Antičić, R. Battiston, W. Braunschweig, Y. H. Chang, C. Y. Chien, A. E. Chen, S. R. Hou, C. H. Lin, W. T. Lin, R. Ostonen, K. Spartiotis, O. Syben, O. Toker, B. Wittmer

研究成果: 雜誌貢獻期刊論文同行評審

5 引文 斯高帕斯(Scopus)

摘要

We present a test beam study of energy straggling and multiple scattering in silicon strip detectors using electrons and pions of momenta up to 50 GeV. Results are compared with GEANT simulation using a simple algorithm to parameterize energy loss distribution. The deflection due to multiple scattering in crystalline structure was investigated by placing a GaAs wafer at various angles.

原文???core.languages.en_GB???
頁(從 - 到)309-314
頁數6
期刊Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
374
發行號3
DOIs
出版狀態已出版 - 1 6月 1996

指紋

深入研究「Energy straggling and multiple scattering in silicon strip detectors」主題。共同形成了獨特的指紋。

引用此