Energy flux associated with a plane crack along an (hyper)elastic bimaterial interface

J. H. Chang, J. B. Yeh

研究成果: 雜誌貢獻期刊論文同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Energy flux associated with a plane crack along an (hyper)elastic bimaterial interface」主題。共同形成了獨特的指紋。

Keyphrases

Engineering