Enabling a B+-tree-based data management scheme for key-value store over SMR-based SSHD

Yu Pei Liang, Tseng Yi Chen, Ching Ho Chi, Hsin Wen Wei, Wei Kuan Shih

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

摘要

Owing to the explosive growth of data volume, high areal density storage technologies have been proposed in the past few years. Among them, shingled magnetic recording (SMR) has been regarded as the most promising candidate to replace current conventional hard disk drive based on the perpendicular magnetic recording technology. However, SMR technology not only brings large capacity storage devices but also results in terrible random access performance. For increasing the random access performance of SMR, solid-state hybrid drive (SSHD) seems a possible solution in storage system development. Nevertheless, when an SMR-based SSHD is adopted to a large-scale data management system, a severe performance degeneration will happen because an indexing scheme for access efficiency always maintains data in the large-scale data management system. More specifically, jointly managing indexing keys and data values on an SSHD drive will result in the massive amount of write amplification because of read-merge-write operations and garbage collection processes. Based on such motivations, this work proposed a total solution, namely XsB+-tree, to establish a high-performance B+-tree-based data management scheme for key-value store systems. To the best of our knowledge, this work is the first work to discuss the total solution for the key-value store over an SMR-based SSHD. According to our experimental results, XsB+ -tree can improve the access time by 80% on average and prolong the lifetime of SSD up to 19%.

原文???core.languages.en_GB???
主出版物標題2020 57th ACM/IEEE Design Automation Conference, DAC 2020
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781450367257
DOIs
出版狀態已出版 - 7月 2020
事件57th ACM/IEEE Design Automation Conference, DAC 2020 - Virtual, San Francisco, United States
持續時間: 20 7月 202024 7月 2020

出版系列

名字Proceedings - Design Automation Conference
2020-July
ISSN(列印)0738-100X

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???event.eventtypes.event.conference???57th ACM/IEEE Design Automation Conference, DAC 2020
國家/地區United States
城市Virtual, San Francisco
期間20/07/2024/07/20

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