Electroreflectance study on the polarization field in InGaN/AlInGaN multiple quantum wells

T. M. Hsu, C. Y. Lai, W. H. Chang, C. C. Pan, C. C. Chuo, J. I. Chyi

研究成果: 雜誌貢獻期刊論文同行評審

26 引文 斯高帕斯(Scopus)

摘要

The polarization field in InGaN/AlInGaN quantum wells (QW) grown on GaN was investigated. The AlInGaN barrier was lattice-matched to the GaN substrate. A paraboliclike energy shift, an intensity minimum and an 180° phase change at the flat-band voltage was revealed by the bias-dependent spectra due to the quantum-confined Stark effect. The results show that the polarization field in the InGaN/AlInGaN QW is reduced significantly and is attributed to the contribution of spontaneous polarization in the quaternary barrier which compensates the piezoelectric polarization in the InGaN QWs.

原文???core.languages.en_GB???
頁(從 - 到)1114-1116
頁數3
期刊Applied Physics Letters
84
發行號7
DOIs
出版狀態已出版 - 16 2月 2004

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