TY - GEN
T1 - Efficient diagnosis algorithms for drowsy SRAMs
AU - Huang, Bing Wei
AU - Li, Jin Fu
PY - 2009
Y1 - 2009
N2 - Memory cores usually occupy a signif cant portion of the chip area of a complex system-on-chip. Thus, the yield of memory cores dominates the yield of the chip. Diagnosis and repair are two important techniques for memory yield improvement. In this paper, we propose two eff cient diagnosis algorithms for drowsy static random access memories (SRAMs). The f rst diagnosis algorithm, March D2, can be used to distinguish drowsy faults (DFs) from non-drowsy faults (NDFs). The second diagnosis algorithm, March D6, can distinguish different fault types of DFs. The March D2 and March D6 require 23N and (10log 2N+17)N Read/Write operations, respectively, for testing an N × W-bit drowsy SRAM.
AB - Memory cores usually occupy a signif cant portion of the chip area of a complex system-on-chip. Thus, the yield of memory cores dominates the yield of the chip. Diagnosis and repair are two important techniques for memory yield improvement. In this paper, we propose two eff cient diagnosis algorithms for drowsy static random access memories (SRAMs). The f rst diagnosis algorithm, March D2, can be used to distinguish drowsy faults (DFs) from non-drowsy faults (NDFs). The second diagnosis algorithm, March D6, can distinguish different fault types of DFs. The March D2 and March D6 require 23N and (10log 2N+17)N Read/Write operations, respectively, for testing an N × W-bit drowsy SRAM.
UR - http://www.scopus.com/inward/record.url?scp=67649666500&partnerID=8YFLogxK
U2 - 10.1109/ISQED.2009.4810307
DO - 10.1109/ISQED.2009.4810307
M3 - 會議論文篇章
AN - SCOPUS:67649666500
SN - 9781424429530
T3 - Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009
SP - 276
EP - 279
BT - Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009
T2 - 10th International Symposium on Quality Electronic Design, ISQED 2009
Y2 - 16 March 2009 through 18 March 2009
ER -