TY - JOUR
T1 - Efficient block-level connectivity verification algorithms for embedded memories
AU - Li, Jin Fu
PY - 2004/12
Y1 - 2004/12
N2 - A large memory is typically designed with multiple identical memory blocks for reducing delay and power. The circuit verification of individual memory blocks can be effectively handled by the Symbolic Trajectory Evaluation (STE) approach. However, if multiple memory blocks are integrated into a single system, the STE approach cannot verify it economically. This paper introduces algorithms for verifying block-level connectivity of memories. The verification time of a large memory can be reduced drastically by using bottom-up verification scheme. That is, a memory block is first verified thoroughly, and then only the interconnection between memory blocks of the large memory needs to be verified. The proposed verification algorithms require (3n+2(⌈log 2n⌉+l)+3⌈log2m⌉) Read/Write operations for a 2n×m-bit memory, where n and m are the address width and data width, respectively. Also, the algorithms can verify 100% of the inter-port and intra-port signal misplaced faults of the address, data input, and data output ports.
AB - A large memory is typically designed with multiple identical memory blocks for reducing delay and power. The circuit verification of individual memory blocks can be effectively handled by the Symbolic Trajectory Evaluation (STE) approach. However, if multiple memory blocks are integrated into a single system, the STE approach cannot verify it economically. This paper introduces algorithms for verifying block-level connectivity of memories. The verification time of a large memory can be reduced drastically by using bottom-up verification scheme. That is, a memory block is first verified thoroughly, and then only the interconnection between memory blocks of the large memory needs to be verified. The proposed verification algorithms require (3n+2(⌈log 2n⌉+l)+3⌈log2m⌉) Read/Write operations for a 2n×m-bit memory, where n and m are the address width and data width, respectively. Also, the algorithms can verify 100% of the inter-port and intra-port signal misplaced faults of the address, data input, and data output ports.
KW - Embedded memories
KW - Signal misplaced fault
KW - System on chip
KW - Verification
UR - http://www.scopus.com/inward/record.url?scp=11144306442&partnerID=8YFLogxK
M3 - 期刊論文
AN - SCOPUS:11144306442
SN - 0916-8508
VL - E87-A
SP - 3185
EP - 3192
JO - IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
JF - IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
IS - 12
ER -