Effects of anisotropy and power spectrum of refractivity irregularities on the determination of layer thickness and layer position using the frequency domain interferometry technique

J. S. Chen, J. Y. Liu, Y. H. Chu

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

10 引文 斯高帕斯（Scopus）

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Engineering & Materials Science

Physics & Astronomy

Earth & Environmental Sciences