Effective gap filling via magnetic field simulation assisted on Longthrow sputtering PVD of side magnet designs and arrangements for 3DIC application

Tomi T. Li, H. T. Chen, J. S. Yeh, Thomas C.K. Yang, S. W. Yang, H. H. Liu, Leo Chiang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

This study used Finite Volume Method to simulate the magnetic profile of PVD (physical vapor deposition) chamber. For this longthrow PVD, the adaptor of the gap filling chamber has 120 mm height and 44 sets of side magnets around the adaptor. The polarity of the side magnets is the same as the top magnets of the chamber. These side magnets can very effectively increase electron mobility and collision frequency with sputtered atoms. The plasma simulation result shows that ionization rate on sputtered atoms can be up to 12% from such a PVD system along with such a magnet arrangement. Therefore, it shows a significant improvement on bottom side-wall coverage of via hole up to 45%. The deposition rate increases by 40%. In addition, the adjustment of RF bias and resputtering power can result in further improvement on 3/4 depth of side-wall coverage by 30% and corner step coverage by 70%. This study uses a simple method to apply 3DIC gap filling capability for an increase of aspect ratio (AR).

原文???core.languages.en_GB???
主出版物標題China Semiconductor Technology International Conference 2012, CSTIC 2012
發行者Electrochemical Society Inc.
頁面857-864
頁數8
版本1
ISBN(電子)9781607683186
ISBN(列印)9781607683186
DOIs
出版狀態已出版 - 2012
事件China Semiconductor Technology International Conference 2012, CSTIC 2012 - Shanghai, China
持續時間: 18 3月 201219 3月 2012

出版系列

名字ECS Transactions
號碼1
44
ISSN(列印)1938-5862
ISSN(電子)1938-6737

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???event.eventtypes.event.conference???China Semiconductor Technology International Conference 2012, CSTIC 2012
國家/地區China
城市Shanghai
期間18/03/1219/03/12

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