Keyphrases
(001) Substrate
50%
Buffer Layer
100%
Crystal Quality
100%
Diffraction Pattern
50%
Epitaxial Growth
100%
Epitaxially Grown
50%
Full Width at Half Maximum
100%
Ge Buffer
50%
Ge Film
100%
Germanium Buffer
100%
Growth Properties
100%
High Efficiency
50%
III-V Solar Cells
50%
Lattice Constant
100%
Magnetron Sputtering
100%
Photodetector
50%
Plane Lattices
50%
Positive Bias
50%
Radio Frequency Magnetron Sputtering
50%
Raman Shift
50%
Si Substrate
50%
Si(111)
50%
Single Crystal
100%
Structural Properties
100%
Substrate Biasing
100%
Substrate Effect
100%
Substrate Holder
50%
Transmission Electron Microscopy
50%
X-ray Diffraction Measurement
50%
Material Science
Buffer Layer
100%
Diffraction Measurement
25%
Diffraction Pattern
25%
Epitaxy
100%
Film
100%
Germanium
100%
Lattice Constant
50%
Magnetron Sputtering
25%
Silicon
100%
Single Crystal
50%
Solar Cell
25%
Structural Property
100%
Thin Films
25%
Transmission Electron Microscopy
25%
X-Ray Diffraction
25%
Engineering
Buffer Layer
100%
Crystalline Quality
100%
Lattice Constant
100%
Magnetron
100%
Photometer
50%
Radio Frequency
50%
Ray Diffraction
50%
Si Substrate
50%
Solar Cell
50%
Structural Property
100%
Thin Films
50%
Physics
Diffraction Pattern
50%
Magnetron
100%
Magnetron Sputtering
50%
Photometer
50%
Single Crystal
100%
Solar Cell
50%
Thin Films
50%
Transmission Electron Microscopy
50%
X Ray Diffraction
50%