@inproceedings{517a17e5e4494c7e8791b985f8b75150,
title = "Disturbance fault testing on various NAND flash memories",
abstract = "Due to the specific mechanism of functional operations, flash memories are prone to disturbance faults. Furthermore, different NAND flash memories might have some differences on the array organizations and the supported functional operations. In this paper, therefore, test algorithms for covering the disturbance faults in various types of NAND flash memories are developed.",
author = "Hou, {Chih Sheng} and Li, {Jin Fu}",
year = "2012",
doi = "10.1109/ETS.2012.6233030",
language = "???core.languages.en_GB???",
isbn = "9781467306973",
series = "Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012",
booktitle = "Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012",
note = "null ; Conference date: 28-05-2012 Through 01-06-2012",
}