@inproceedings{68f27a29e76c44758036a4f63588b261,
title = "Distributed fault simulation for sequential circuits by pattern partitioning",
abstract = "In this paper, we target the pattern partitioning on the distributed fault simulation because the number of patterns can be reduced by a factor of n, the number of machines, and the faults detected by any machine can be dropped through the communication of the network.",
author = "Wu, {Wen Ching} and Lee, {Chung Len} and Chen, {Jwu E.} and Lin, {Won Yih}",
year = "1994",
language = "???core.languages.en_GB???",
isbn = "0818654112",
series = "Proceedings of the European Design and Test Conference",
publisher = "Publ by IEEE",
pages = "661",
editor = "Anon",
booktitle = "Proceedings of the European Design and Test Conference",
note = "Proceedings of the European Design and Test Conference ; Conference date: 28-02-1994 Through 03-03-1994",
}