TY - JOUR
T1 - Direct Simulation of the Full-Wave Partial Element Equivalent Circuit Using Standard SPICE [Application Notes]
AU - Chou, Chiu Chih
AU - Wu, Tzong Lin
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - The partial element equivalent circuit (PEEC) [1] is a computational electromagnetic (EM) method featuring circuit-oriented solutions for full-wave (FW) EM problems. An arbitrary threedimensional structure consisting of conductors and dielectric/magnetic materials can, after proper discretization, be transformed into an equivalent circuit composed of inductors, capacitors, and controlled sources that may be solved using a Simulation Program With Integrated Circuit Emphasis (SPICE)-like simulator or can be combined with external lumped circuits in a straightforward manner. Classical and recent applications of PEEC include interconnect modeling [2], [3], power integrity analysis [4], transient lightning modeling [5], transient electrostatic discharge simulation [6], power electronics [7], antenna analysis [8], [9], and modeling of magnetic materials [10]. Three very good and in-depth treatments of the subject can be found in [11][13].
AB - The partial element equivalent circuit (PEEC) [1] is a computational electromagnetic (EM) method featuring circuit-oriented solutions for full-wave (FW) EM problems. An arbitrary threedimensional structure consisting of conductors and dielectric/magnetic materials can, after proper discretization, be transformed into an equivalent circuit composed of inductors, capacitors, and controlled sources that may be solved using a Simulation Program With Integrated Circuit Emphasis (SPICE)-like simulator or can be combined with external lumped circuits in a straightforward manner. Classical and recent applications of PEEC include interconnect modeling [2], [3], power integrity analysis [4], transient lightning modeling [5], transient electrostatic discharge simulation [6], power electronics [7], antenna analysis [8], [9], and modeling of magnetic materials [10]. Three very good and in-depth treatments of the subject can be found in [11][13].
UR - http://www.scopus.com/inward/record.url?scp=85065565675&partnerID=8YFLogxK
U2 - 10.1109/MMM.2019.2904376
DO - 10.1109/MMM.2019.2904376
M3 - 期刊論文
AN - SCOPUS:85065565675
SN - 1527-3342
VL - 20
SP - 22
EP - 34
JO - IEEE Microwave Magazine
JF - IEEE Microwave Magazine
IS - 6
M1 - 8709028
ER -