Diagnosis of the joint backlash of a mechanism-Wigner-Ville distribution combined with correlation techniques

M. C. Pan, B. Verbeure, H. Van Brussel, P. Sas

研究成果: 書貢獻/報告類型篇章同行評審

1 引文 斯高帕斯(Scopus)

指紋

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Keyphrases

Engineering