@inproceedings{87c0aaa5b15e469c9f730b9aa82373fe,
title = "Diagnosis algorithms for locating bridge defects in multi-port RAMs",
abstract = "Multi-port random access memory (MPRAM) is widely used in system-on-chip (SOC) designs. This paper presents two defect-location algorithms (DLAs) for locating the bridge defects between word-lines and bit-lines in a MPRAM. Once faulty rows or faulty columns are detected by a typical test for functional faults, the DLAs can be used to locate bridge defects between bit-lines or word-lines if such bridge defects exist. For a k-port MPRAM, the proposed word-line DLA and bit-line DLA requires (4k+9)m and 10n test operations to locate bit-line and word-line bridge defects if the MPRAM with m detected faulty rows and n detected faulty columns.",
author = "Tseng, {Tsu Wei} and Li, {Jin Fu}",
year = "2009",
doi = "10.1109/CAS-ICTD.2009.4960808",
language = "???core.languages.en_GB???",
isbn = "9781424425877",
series = "2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD'09",
booktitle = "2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD'09",
note = "2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD'09 ; Conference date: 28-04-2009 Through 29-04-2009",
}