@inproceedings{16e8ef0913d14378981180f1eef21831,
title = "DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs",
abstract = "Spin-transfer-torque magnetoresistive random access memory (STT-MRAM) is one promising nonvolatile memory. In this paper, a design-for-testability (DFT)-enhanced test scheme is proposed to enhance the test quality of STT-MRAMs by adaptively adjusting the read current of the read test operations using a read current-adjustable DFT (RCA-DFT) circuit. A march test, March-MT, is proposed as well. Together with RCA-DFT, March-MT requires 11N test complexity to achieve about 7.26 times of total test quality improvement in comparison with a March-6N test algorithm with fixed read current for a STT-MRAM with N words.",
keywords = "DFT, March test, STT MRAM, Test",
author = "Pan, {Ze Wei} and Li, {Jin Fu}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Test Conference, ITC 2022 ; Conference date: 23-09-2022 Through 30-09-2022",
year = "2022",
doi = "10.1109/ITC50671.2022.00058",
language = "???core.languages.en_GB???",
series = "Proceedings - International Test Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "489--493",
booktitle = "Proceedings - 2022 IEEE International Test Conference, ITC 2022",
}