Device stress evaluation of InAs/AlSb HEMT on silicon substrate with refractory iridium Schottky gate metal
Hsien Chin Chiu, Wen Yu Lin, Chia Yi Chou, Shih Hsien Yang, Kai Di Mai, Pei Chin Chiu, W. J. Hsueh, Jen Inn Chyi
研究成果: 雜誌貢獻 › 期刊論文 › 同行評審
5
引文
斯高帕斯(Scopus)