Device stress evaluation of InAs/AlSb HEMT on silicon substrate with refractory iridium Schottky gate metal

Hsien Chin Chiu, Wen Yu Lin, Chia Yi Chou, Shih Hsien Yang, Kai Di Mai, Pei Chin Chiu, W. J. Hsueh, Jen Inn Chyi

研究成果: 雜誌貢獻期刊論文同行評審

5 引文 斯高帕斯(Scopus)

指紋

深入研究「Device stress evaluation of InAs/AlSb HEMT on silicon substrate with refractory iridium Schottky gate metal」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds