Development of growth model on interfacial intermetallic compound at circular Cu/Sn3.5Ag interface

C. Y. Yeh, J. Y. Wang, C. Y. Wu, C. Y. Chiu, C. H. Lee, B. R. Huang, K. L. Fu, J. S. Chang, T. H. Yen, Y. F. Lee, C. Y. Liu

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)

指紋

深入研究「Development of growth model on interfacial intermetallic compound at circular Cu/Sn3.5Ag interface」主題。共同形成了獨特的指紋。

Keyphrases

Engineering

Material Science