Developing a novel patent map to explore R&D directions and technical gaps for thin-film photovoltaic industry

D. S. Chang, C. H. Kao

研究成果: 書貢獻/報告類型會議論文篇章同行評審

3 引文 斯高帕斯(Scopus)

摘要

This paper addresses a novel technical patent map to effectively mining the patent information among assignee, patent classification, and filing date on thin-film photovoltaic. The proposed technical patent map provides an overall view of technological advancement that allows researchers to monitor competitor deployments, mine the techniques gap, and forecast technology trends. There are 164 patent documents approved by the United States Patent and Trademark Office is employed in the patent analysis. Results indicate that thin-film photovoltaic technology focuses on the fields related to semiconductor devices and the surface treatment of metal materials, which can be deemed as foundational or popular types of technology. However, the technology related to refinement, manufacturing, and after-treatment for metal, monocrystalline, and polycrystalline materials, as well as plating, coating, and connecting surface technologies have been overlooked. In addition, the leading enterprises in capable of continuous innovation and cross-field technology R&D are further identified.

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主出版物標題IEEM 2009 - IEEE International Conference on Industrial Engineering and Engineering Management
頁面59-63
頁數5
DOIs
出版狀態已出版 - 2009
事件IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2009 - Hong Kong, China
持續時間: 8 12月 200911 12月 2009

出版系列

名字IEEM 2009 - IEEE International Conference on Industrial Engineering and Engineering Management

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???event.eventtypes.event.conference???IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2009
國家/地區China
城市Hong Kong
期間8/12/0911/12/09

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