Determination of Suitable Indicators of AlGaN/GaN HEMT Wafer Quality Based on Wafer Test and Device Characteristics

Yi Nan Zhong, Shun Wei Tang, Yue Ming Hsin

研究成果: 雜誌貢獻期刊論文同行評審

4 引文 斯高帕斯(Scopus)

指紋

深入研究「Determination of Suitable Indicators of AlGaN/GaN HEMT Wafer Quality Based on Wafer Test and Device Characteristics」主題。共同形成了獨特的指紋。

Keyphrases

Engineering

Material Science