Design and Test of Computing-In Memories

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

Computing-in-memory architecture is one good candidate for overcoming the memory-wall bottleneck of von Neumann computing architecture. Many approaches were proposed to modify different types of memories to support the computing function. This paper provides a brief tutorial on computing-in memory (CIM) designs and test techniques. Also, some challenges of CIM design and testing are discussed.

原文???core.languages.en_GB???
主出版物標題Proceedings - International SoC Design Conference 2022, ISOCC 2022
發行者Institute of Electrical and Electronics Engineers Inc.
頁面157-158
頁數2
ISBN(電子)9781665459716
DOIs
出版狀態已出版 - 2022
事件19th International System-on-Chip Design Conference, ISOCC 2022 - Gangneung-si, Korea, Republic of
持續時間: 19 10月 202222 10月 2022

出版系列

名字Proceedings - International SoC Design Conference 2022, ISOCC 2022

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???event.eventtypes.event.conference???19th International System-on-Chip Design Conference, ISOCC 2022
國家/地區Korea, Republic of
城市Gangneung-si
期間19/10/2222/10/22

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