Delta-ray production in silicon tracking systems for 2-50 GeV electrons

S. R. Hou, G. Ambrosi, W. J. Burger, Y. H. Chang, A. E. Chen, W. T. Lin, N. Produit, M. Ribordy

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)

摘要

The production of δ-ray electrons in silicon strip tracking systems is measured for electrons in the energy range of 2-50 GeV. The results are compared to GEANT calculations. The production cutoff threshold is calibrated, and a value of Tcut = 500 keV is chosen. The δ-ray angular distribution is measured for electrons transmitting through a 320 μm silicon wafer. The δ-ray production rate is approximately 1.3% within an angular region of 1-50 mrad.

原文???core.languages.en_GB???
頁(從 - 到)145-153
頁數9
期刊Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
418
發行號1
DOIs
出版狀態已出版 - 21 11月 1998

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