Cu Nanoparticle Sintering by Electrical Current

Albert T. Wu, Tzu Hao Sheng, Jui Lin Chao, Chang Meng Wang, Watson Tseng

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

In this research, copper nanoparticles are packed into a V-shaped groove etched on a silicon substrate to explore how electric current affects their sintering process. This sintering is effectively carried out at a room temperature of 25°C. U sing an electrical current in the sintering process significantly reduces void formation in the copper, which is a notable improvement over non-electrically assisted methods. Conducting the process at ambient temperature is beneficial as it minimizes the effects of Joule heating. Critical aspects of this process involve the stimulation of atomic movement by the electric current and the migration of atoms over the surfaces of the particles. There is a particular focus on the current crowding phenomenon that occurs in the narrow regions between particles. The study aims to elucidate the importance of how electric current impacts the compaction and electrical properties of copper nanoparticles.

原文???core.languages.en_GB???
主出版物標題2024 International Conference on Electronics Packaging, ICEP 2024
發行者Institute of Electrical and Electronics Engineers Inc.
頁面107-108
頁數2
ISBN(電子)9784991191176
DOIs
出版狀態已出版 - 2024
事件23rd International Conference on Electronics Packaging, ICEP 2024 - Toyama, Japan
持續時間: 17 4月 202420 4月 2024

出版系列

名字2024 International Conference on Electronics Packaging, ICEP 2024

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???23rd International Conference on Electronics Packaging, ICEP 2024
國家/地區Japan
城市Toyama
期間17/04/2420/04/24

指紋

深入研究「Cu Nanoparticle Sintering by Electrical Current」主題。共同形成了獨特的指紋。

引用此