Critical time of the lognormal distribution

研究成果: 雜誌貢獻期刊論文同行評審

3 引文 斯高帕斯(Scopus)

摘要

The critical time is the time point as the failure rate starts to decrease and also as the mean residual lifetime starts to increase. The estimated critical time is useful for determining the duration of a burn-in process. The method for estimating the critical time of the failure rate for lognormal lifetime distribution is discussed. A single time censored data is used as a example for illustration.

原文???core.languages.en_GB???
頁(從 - 到)261-266
頁數6
期刊Microelectronics Reliability
34
發行號2
DOIs
出版狀態已出版 - 2月 1994

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