Conference Reports: Report on 2017 IEEE Asian Test Symposium

Jin Fu Li, Jiun Lang Huang

研究成果: 雜誌貢獻期刊論文同行評審

摘要

The Asian Test Symposium 2017 (ATS'17) was held during 27-30 November 2017 at Palais de Chine Hotel, Taipei, Taiwan. The ATS has been the largest event in Asia that focuses on the testing of integrated circuits and systems, and it has attracted researchers and engineers from all over the world to share their experiences and knowledge. ATS'17 was organized by the National Central University, which cosponsored the event jointly with IEEE Test Technology Technical Council. ATS'17 was also supported by the following corporate sponsors: Ministry of Science Technology, Bureau of Foreign Trade, Ministry of Education, Taipei Department of Information and Tourism, Synopsys, Mentor Graphics, Cadence, Industrial Technology Research Institute (ITRI), and Realtek.

原文???core.languages.en_GB???
頁(從 - 到)103-104
頁數2
期刊IEEE Design and Test
35
發行號2
DOIs
出版狀態已出版 - 4月 2018

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