摘要
When a linearly polarized light passes through a uniaxial crystal, small wavelength shifts will introduce phase difference variations between s- and p-polarizations. These phase difference variations can be measured accurately by heterodyne interferometry. Based on these facts, a common-path heterodyne interferometric detection scheme for measuring wavelength shift is proposed. This scheme has the advantages of both common-path interferometry and heterodyne interferometry.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 7-10 |
頁數 | 4 |
期刊 | Optics Communications |
卷 | 162 |
發行號 | 1 |
DOIs | |
出版狀態 | 已出版 - 1 4月 1999 |