Checkpoints in irredundant two-level combinational circuits

Jwu E. Chen; Chung Len Lee; Wen Zen Shen

doi:10.1007/BF00135233

Checkpoints in irredundant two-level combinational circuits

Jwu E. Chen, Chung Len Lee, Wen Zen Shen

電機工程學系

研究成果: 雜誌貢獻 › 通訊期刊論文 › 同行評審

1 引文斯高帕斯（Scopus）

摘要

It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.

原文	???core.languages.en_GB???
頁（從 - 到）	395-397
頁數	3
期刊	Journal of Electronic Testing: Theory and Applications (JETTA)
卷	2
發行號	4
DOIs	https://doi.org/10.1007/BF00135233
出版狀態	已出版 - 11月 1991

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10.1007/BF00135233

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abstract = "It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.",

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AB - It is shown that for a two-level irredundant single/multiple output combinational circuit, the checkpoints consist of all primary inputs without fanout, and all fanout branches in the circuit. Any test set that detects all single stuck faults on these checkpoints will also detect all single stuck faults in the circuit.

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Checkpoints in irredundant two-level combinational circuits

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