BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

27 引文斯高帕斯（Scopus）

原文	???core.languages.en_GB???
主出版物標題	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
發行者	IEEE
頁面	292-297
頁數	6
ISBN（列印）	0818605405
出版狀態	已出版 - 1984

名字	Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)
ISSN（列印）	0731-3071

引用此

@inproceedings{53d1ed940ede43368167dc845c00b979,

title = "BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.",

author = "Hua, \{Kien A.\} and Jou, \{Jing Yang\} and Abraham, \{Jacob A.\}",

year = "1984",

language = "???core.languages.en\_GB???",

isbn = "0818605405",

series = "Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)",

publisher = "IEEE",

pages = "292--297",

booktitle = "Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)",

}

TY - GEN

T1 - BUILT-IN TEST FOR VLSI FINITE-STATE MACHINES.

AU - Hua, Kien A.

AU - Jou, Jing Yang

AU - Abraham, Jacob A.

PY - 1984

Y1 - 1984

UR - https://www.scopus.com/pages/publications/0021183635

M3 - 會議論文篇章

AN - SCOPUS:0021183635

SN - 0818605405

T3 - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

SP - 292

EP - 297

BT - Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

PB - IEEE

ER -