Built-In Self-Test Design for the 3D-Stacked Wide-I/O DRAM

Keyphrases

• Built-in-self-test (BiST) 100%
• Test Design 100%
• 3D Stacking 100%
• Smartphone 50%
• Low Power 50%
• Mobile Devices 50%
• Area Overhead 50%
• Fault Detection 50%
• Test Time Reduction 50%
• Die Stacking 50%
• Test Interface 50%
• Interface Structure 50%
• Stack Configuration 50%
• TSV Test 50%
• Channel Test 50%
• Handheld Gaming 50%
• Gaming Consoles 50%

Computer Science

• build-in self-test 100%
• Input/Output 100%
• Experimental Result 25%
• Good Performance 25%
• Gaming Console 25%
• Fault detection 25%
• Mobile Device 25%

Engineering

• Built-in Self Test 100%
• Test Time 28%
• Experimental Result 14%
• Logic Die 14%
• Test Procedure 14%
• Good Performance 14%
• Area Overhead 14%
• Main Benefit 14%
• Mobile Phones 14%