摘要
Silicon carbide (SiC) has emerged as a candidate material for next-generation power devices to replace traditional silicon power devices. They feature smaller size, faster switching speed, simpler cooling, and greater reliability than Si-MOSFETs. To date, however, the thermal conductance of GeC-based power MOSFETs is unclear. This work explains the heat transfer of GeC by simulating the thermal conductivity through molecular dynamics (MD) and proposes a potential 4H-GeC power MOSFET with wide bandgap and high thermal conductivity to replace Si-MOSFETs.
原文 | ???core.languages.en_GB??? |
---|---|
文章編號 | SC8001 |
期刊 | Japanese Journal of Applied Physics |
卷 | 62 |
DOIs | |
出版狀態 | 已出版 - 1 4月 2023 |